Call For Papers

  • Authors should submit their papers online at Unregistered authors should first create an account on EDAS to log on.

    Authors are invited to submit original unpublished research work that demonstrates the recent advances in the following area of interest, but are not limited to :


    Signal Processing for Communication
    Image & Video Signal Processing
    Medical Imaging
    Image Forensic
    DSP Algorithms & Architectures
    Pattern Analysis & Classification
    Large Dimensional Signal Processing
    Compressive Sensing
    Statistical Signal Processing
    VLSI for Digital Signal Processing
    Speech & Audio Processing
    Biomedical Signal Processing


    Communication Theory & Systems
    Information Theory & Coding
    Wireless, Mobile & Vehicular
    Satellite Communication
    Cooperative Communication
    Cognitive Radio
    Optical Communications & Networks
    RF & Microwave Communication
    Smart Grid Communication
    Telecom Networks
    VLSI for Communications

    VLSI Technology and Embedded Systems

    Ultra-Low Power Design
    Smart Grids Green Technologies
    Embedded Multi-Core
    Embedded System Reliability
    System-Level Design Methodology
    Giga-Scale Design Methodology
    Processor and Memory Design
    Defect Tolerant Architectures
    Logic Synthesis, Verification and Physical Design
    Test and Reliability
    Device/Circuit Simulation and Modeling
    CAD/EDA Methodologies for Nanotechnology
    Post-CMOS Devices


    Papers will be reviewed by renowned experts in their field and those selected will be called for presentation and inclusion in the conference proceeding based on their clarity,originality, relevance and significance.

    Click here to view the Session Plan of ICSC 2015.
    Click here to view the Hotel details.
    Paper submission is now closed.
    All accepted papers will be considered for publication in IEEE Xplore.
    ISBN Number Compliant PDF Files/packing list: 978-1-4799-6761-2 CD: 978-1-4799-6760-5
    IEEE Conference Record No.: 34456
    IEEE Conference ID: 34456XP